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Kód záznamu = ("0174705" NEBO "0177788" NEBO "0180014" NEBO "0181912" NEBO "0183228" NEBO "0185674")
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 6 2013 . New York American Institute of Physics 2013
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 5 2013 . New York American Institute of Physics 2013
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 4 2013 . New York American Institute of Physics 2013
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 3 2013 . New York American Institute of Physics 2013
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 2 2013 . New York American Institute of Physics 2013
- Journal of vacuum science and technology B: microelectronics and nanometer structures, processing, measurement and phenomenaRoč. 31 č. 1 2013 . New York American Institute of Physics 2013