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- A practical guide to optical metrology for thin films / Michael Quinten . Weinheim : Wiley-VCH, c2013 . xii, 211 s.
Dislocation Available Unavail./Only at library Issued Reservations FY - Kormunda Ing. 0 0/1 0 0
| Dislocation | Available | Unavail./Only at library | Issued | Reservations |
|---|---|---|---|---|
| FY - Kormunda Ing. | 0 | 0/1 | 0 | 0 |
