Search results

  1. Rentgenová spektrometrie : sborník přednášek z kurzu / [uspořádal Václav Helán]   .  Český Těšín :  2 Theta,  2005 . 285 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    volný výběr10/000
  2. Thin film analysis by X-ray scattering / Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel   .  Weinheim :  Wiley-VCH,  c2006 . xxii, 356 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    UMC - Ryšánek Mgr.00/100


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