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- Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy . New York : Springer, [2018] ©2018 . xxiii, 550 stran
Dislocation Available Unavail./Only at library Issued Reservations volný výběr 0 0/0 1 0 - Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.] . New York : Springer : 2007 . xix, 690 s.
Dislocation Available Unavail./Only at library Issued Reservations FY - Kormunda Ing. 0 0/1 0 0 - Zkoumání látek elektronovým paprskem / Václav Hulínský, Karel Jurek . Praha : SNTL, 1983 . 401 s.
Dislocation Available Unavail./Only at library Issued Reservations sklad D 1 0/0 0 0
