Search results

  1. Applications of neutron powder diffraction / Erich H. Kisi, Christopher J. Howard   .  Oxford ; New York :  Oxford University Press,  2008 . xvii, 486 s., [4] s. obr. příl.
    Dislocation Available Unavail./Only at library Issued Reservations
    volný výběr10/000
  2. Diffraction methods in materials science / J. B. Cohen   .  New York :  MacMillan,  1966 . 357 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    sklad E10/000
  3. Electron diffraction : an introduction for biologists / D. L. Misell, E. B. Brown   .  Amsterdam :  Elsevier,  1987 . xvi, 287 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    sklad E10/000
  4. Magnetronová depozice oxidů pro TCO aplikace / Pavel Sláma   .  2019 . 44 listů
    Dislocation Available Unavail./Only at library Issued Reservations
    sklad C00/100
  5. Metody analýzy povrchů : elektronová mikroskopie a difrakce / editoři Ludmila Eckertová, Luděk Frank ; autoři Armin Delong ... [et al.]   .  Praha :  Academia,  1996 . 379 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    sklad D00/010
  6. Microstructure of AlCrFeSi alloys prepared by high-pressure spark plasma sintering / Anna Knaislová, Daniel Kučera, Alena Michalcová, Ivo Marek, Sławomir Cygan, Lucyna Jaworska   .  Manufacturing Technology.Vol. 18, no. 5, strana 753-757.
    Microstructure of AlCrFeSi alloys prepared by high-pressure spark plasma sintering
  7. Structure of materials : an introduction to crystallography, diffraction and symmetry / Marc De Graef, Michael E. McHenry   .  Cambridge :  Cambridge University Press,  2012 . xxxii, 739 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    FY - Kormunda Ing.00/100
    TMI – Náprstková Doc. 00/100
  8. Thin film analysis by X-ray scattering / Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel   .  Weinheim :  Wiley-VCH,  c2006 . xxii, 356 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    UMC - Ryšánek Mgr.00/100
  9. Transmission electron microscopy : a textbook for materials science. Part 2, Diffraction / David B. Williams, C. Barry Carter   .  New York, N.Y. :  Springer,  c2009 . lxii, s. 197-368, I-15 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    FY - Kormunda Ing.00/100
  10. Vytyčování přímek využitím Fresnelovy difrakce = The stright-line alignment using the Fresnel diffraction : zkrácená verze Ph.D. Thesis / Karel Velechovský   .  Brno :  Vysoké učení technické v Brně, Fakulta strojního inženýrství, Ústav fyzikálního inženýrství,  c2004 . 29 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    sklad D10/000


  This site uses cookies to make them easier to browse. Learn more about how we use cookies.