Number of the records: 1  

A practical guide to optical metrology for thin films

  1. A practical guide to optical metrology for thin films / Michael Quinten   .  Weinheim :  Wiley-VCH,  c2013 . xii, 211 s.
    Dislocation Available Unavail./Only at library Issued Reservations
    FY - Kormunda Ing.00/100

Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.