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Reliability and failure of electronic materials and devices

  1. Reliability and failure of electronic materials and devices / Milton Ohring with Lucian Kasprzak   .  Amsterdam : Academic Press, [2015]  ©2015 . xxiv, 734 stran
    Dislocation Available Unavail./Only at library Issued Reservations
    volný výběr10/000

Number of the records: 1  

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