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1.Thin film analysis by X-ray scattering
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Thin film analysis by X-ray scattering / Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel . Weinheim : Wiley-VCH, c2006 . xxii, 356 s.

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UMC - Ryšánek Mgr. 0 0/1 0 0
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